International
Electrotechnical
Commission
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Area
Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection
/ Materials for Surface Acoustic Wave (SAW) devices
IEV ref
561-07-39
en
wafer thickness
thickness measured at the centre of the wafer
fr
épaisseur de la plaquette
, f
épaisseur mesurée au centre de la plaquette
ar
سمك الرقاقة
de
Waferdicke, f
es
espesor de oblea
it
spessore della fetta
ko
웨이퍼 두께
ja
ウェハの厚さ
pl
grubość płytki, f
pt
espessura da bolacha
zh
晶片厚度
Publication date:
2014-11
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