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Area Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection / Materials for Surface Acoustic Wave (SAW) devices

IEV ref561-07-39

en
wafer thickness
thickness measured at the centre of the wafer

fr
épaisseur de la plaquette, f
épaisseur mesurée au centre de la plaquette

ar
سمك الرقاقة

de
Waferdicke, f

es
espesor de oblea

it
spessore della fetta

ko
웨이퍼 두께

ja
ウェハの厚さ

pl
grubość płytki, f

pt
espessura da bolacha

zh
晶片厚度

Publication date: 2014-11
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