![Hide details for [<u>Section 561-01: Piezoelectric and dielectric resonators</u>]](/iev/iev.nsf/blank.gif?OpenImageResource) Section 561-01: Piezoelectric and dielectric resonators |  |
| 561-01-01 | | adjustment tolerance | |
| 561-01-02 | | ageing tolerance | |
| 561-01-03 | | ageing, <of a piezoelectric resonator> | |
| 561-01-04 | | anti-resonance frequency | |
| 561-01-05 | | bus bar | |
| 561-01-06 | | capacitance ratio | |
| 561-01-07 | | centre frequency | |
| 561-01-08 | | clamped capacitance, <of a piezoelectric resonator> | |
| 561-01-09 | | coaxial dielectric resonator | |
| 561-01-10 | | coplanar resonator | |
| 561-01-11 | | coupling factor, <of SAW materials> | |
| 561-01-12 | | crystal element | |
| 561-01-13 | | crystal resonator | |
| 561-01-14 | | crystal unit | |
| 561-01-15 | | DC breakdown voltage | |
| 561-01-16 | | dielectric material | |
| 561-01-17 | | dielectric resonator | |
| 561-01-18 | | dielectric support | |
| 561-01-19 | | drive level | |
| 561-01-20 | | drive level dependency | |
| 561-01-21 | | electrode, <of a piezoelectric resonator> | |
| 561-01-22 | | electromechanical coupling factor, <of a piezoelectric resonator> | |
| 561-01-23 | | enclosure, <of a piezoelectric device> | |
| 561-01-24 | | equivalent circuit, <of a piezoelectric resonator> | |
| 561-01-25 | | external quality factor | |
| 561-01-26 | | figure of merit, <of piezoelectric and dielectric resonators> | |
| 561-01-27 | | fractional load resonance frequency offset | |
| 561-01-28 | | fractional pulling range | |
| 561-01-29 | | free capacitance, <of a piezoelectric resonator> | |
| 561-01-30 | | frequency of minimum impedance | |
| 561-01-31 | | frequency of maximum impedance | |
| 561-01-32 | | frequency pulling range | |
| 561-01-33 | | frequency tolerance | |
| 561-01-34 | | frequency range, <of a resonator unit> | |
| 561-01-35 | | fundamental crystal unit | |
| 561-01-36 | | fundamental mode | |
| 561-01-37 | | half wavelength resonator | |
| 561-01-38 | | hybrid mode dielectric resonator | |
| 561-01-39 | | input capacitance, <of a two-port SAW resonator> | |
| 561-01-40 | | insertion attenuation, <of a two-port SAW resonator> | |
| 561-01-41 | | IDT | |
| 561-01-42 | | load capacitance | |
| 561-01-43 | | load resonance resistance | |
| 561-01-44 | | load resonance frequency | |
| 561-01-45 | | load resonance frequency offset | |
| 561-01-46 | | loaded quality factor | |
| 561-01-47 | | mass loading, <of a SAW device> | |
| 561-01-48 | | metal strip array | |
| 561-01-49 | | microstripline resonator | |
| 561-01-50 | | mode of vibration | |
| 561-01-51 | | motional capacitance | |
| 561-01-52 | | motional inductance | |
| 561-01-53 | | motional resistance | |
| 561-01-54 | | motional resonance frequency | |
| 561-01-55 | | mounting system, <of a resonator> | |
| 561-01-56 | | multimode dielectric resonator | |
| 561-01-57 | | one-port SAW resonator | |
| 561-01-58 | | operable temperature range, <of a resonator> | |
| 561-01-59 | | operating phase shift | |
| 561-01-60 | | operating temperature range, <of a device> | |
| 561-01-61 | | output capacitance, <of a two-port SAW resonator> | |
| 561-01-62 | | overall frequency tolerance | |
| 561-01-63 | | overtone crystal unit | |
| 561-01-64 | | overtone mode | |
| 561-01-65 | | overtone order | |
| 561-01-66 | | parallel resonance frequency | |
| 561-01-67 | | partially clamped capacitance | |
| 561-01-68 | | piezoelectric ceramic element | |
| 561-01-69 | | piezoelectric ceramic resonator | |
| 561-01-70 | | piezoelectric resonator unit | |
| 561-01-71 | | piezoelectric stiffened mode of vibration | |
| 561-01-72 | | piezoelectric unstiffened mode of vibration | |
| 561-01-73 | | pulling sensitivity | |
| 561-01-74 | | quality factor for a series resonance circuit, <of a resonator> | |
| 561-01-75 | | quarter wavelength resonator | |
| 561-01-76 | | reference temperature, <of a resonator> | |
| 561-01-77 | | relative frequency spacing | |
| 561-01-78 | | resonance frequency | |
| 561-01-79 | | resonance frequency, <of a dielectric resonator> | |
| 561-01-80 | | resonance resistance | |
| 561-01-81 | | shunt capacitance | |
| 561-01-82 | | socket | |
| 561-01-83 | | spurious resonance | |
| 561-01-84 | | spurious resonance rejection | |
| 561-01-85 | | stripline resonator | |
| 561-01-86 | | SAW | |
| 561-01-87 | | SAWR | |
| 561-01-88 | | tolerance over the temperature range | |
| 561-01-89 | | transverse spurious resonance, <of a SAW device> | |
| 561-01-90 | | transverse electric mode dielectric resonator | |
| 561-01-91 | | transverse electromagnetic mode | |
| 561-01-92 | | TEM mode dielectric resonator | |
| 561-01-93 | | tuning inductance, <of a two-port SAW resonator> | |
| 561-01-94 | | two-port SAW resonator | |
| 561-01-95 | | unloaded quality factor, <of a dielectric resonator> | |
| 561-01-96 | | working frequency | |
| Section 561-02: Piezoelectric and dielectric filters | |
| 561-02-01 | | apodization of IDT | |
| 561-02-02 | | available power | |
| 561-02-03 | | band pass filter | |
| 561-02-04 | | band stop filter | |
| 561-02-05 | | comb filter | |
| 561-02-06 | | coupling factor for dielectric filters | |
| 561-02-07 | | cut-off frequency | |
| 561-02-08 | | dispersive filter | |
| 561-02-09 | | distortion of envelope delay time, <in an electrical network> | |
| 561-02-10 | | envelope delay time | |
| 561-02-11 | | feed-through signals | |
| 561-02-12 | | feed-through signal suppression | |
| 561-02-13 | | fractional bandwidth | |
| 561-02-14 | | frequency asymmetrical filter | |
| 561-02-15 | | frequency symmetrical filter | |
| 561-02-16 | | group delay time | |
| 561-02-17 | | group delay distortion | |
| 561-02-18 | | high-pass filter | |
| 561-02-19 | | interdigitated interdigital transducer | |
| 561-02-20 | | input impedance | |
| 561-02-21 | | input level | |
| 561-02-22 | | insertion attenuation, <of a filter> | |
| 561-02-23 | | intermodulation distortion | |
| 561-02-24 | | ladder filter | |
| 561-02-25 | | lattice filter | |
| 561-02-26 | | low-pass filter | |
| 561-02-27 | | maximum level | |
| 561-02-28 | | mid-band frequency, <of a band-pass filter or a band-stop filter> | |
| 561-02-29 | | minimum insertion attenuation | |
| 561-02-30 | | multiphase transducer | |
| 561-02-31 | | nominal frequency | |
| 561-02-32 | | nominal group delay | |
| 561-02-33 | | nominal insertion attenuation | |
| 561-02-34 | | nominal level | |
| 561-02-35 | | output impedance | |
| 561-02-36 | | output level | |
| 561-02-37 | | pass band, <of a piezoelectric filter> | |
| 561-02-38 | | pass bandwidth | |
| 561-02-39 | | pass-band ripple, <of a filter> | |
| 561-02-40 | | pass-band attenuation deviation | |
| 561-02-41 | | phase delay time | |
| 561-02-42 | | power flow vector | |
| 561-02-43 | | power flow angle | |
| 561-02-44 | | phase distortion, <of an electrical network> | |
| 561-02-45 | | rated level | |
| 561-02-46 | | reference frequency | |
| 561-02-47 | | reference temperature | |
| 561-02-48 | | reflected wave signal suppression | |
| 561-02-49 | | reflector | |
| 561-02-50 | | reflection coefficient | |
| 561-02-51 | | relative attenuation | |
| 561-02-52 | | resonator filter | |
| 561-02-53 | | roll-off rate | |
| 561-02-54 | | return attenuation | |
| 561-02-55 | | surface acoustic wave filter | |
| 561-02-56 | | SAW beam steering | |
| 561-02-57 | | diffraction, <SAW> | |
| 561-02-58 | | selectivity | |
| 561-02-59 | | shape factor, <of a band-pass filter or a band-stop filter> | |
| 561-02-60 | | shielding electrode | |
| 561-02-61 | | spurious attenuation | |
| 561-02-62 | | spurious reflections | |
| 561-02-63 | | spurious response | |
| 561-02-64 | | spurious response rejection | |
| 561-02-65 | | stop band, <of a piezoelectric filter> | |
| 561-02-66 | | stop bandwidth | |
| 561-02-67 | | storage temperature range | |
| 561-02-68 | | suppression corrugation | |
| 561-02-69 | | temperature characteristics of mid-band frequency | |
| 561-02-70 | | temperature coefficient of mid-band frequency | |
| 561-02-71 | | temperature cyclic drift of mid-band frequency | |
| 561-02-72 | | terminating impedance | |
| 561-02-73 | | total power loss | |
| 561-02-74 | | transducer attenuation | |
| 561-02-75 | | transducer phase | |
| 561-02-76 | | transition band | |
| 561-02-77 | | transversal filter | |
| 561-02-78 | | trap attenuation | |
| 561-02-79 | | trap frequency | |
| 561-02-80 | | triple transit echo | |
| 561-02-81 | | TTE ripple | |
| 561-02-82 | | unidirectional interdigital transducer | |
| 561-02-83 | | unwanted response | |
| Section 561-03: Piezoelectric and dielectric oscillators | |
| 561-03-01 | | adjustment frequency | |
| 561-03-02 | | Allan variance of fractional frequency fluctuation | |
| 561-03-03 | | amplitude modulation distortion | |
| 561-03-04 | | crystal cut | |
| 561-03-05 | | decay time | |
| 561-03-06 | | electrostatic discharge | |
| 561-03-07 | | frequency adjustment range | |
| 561-03-08 | | frequency/load coefficient | |
| 561-03-09 | | frequency offset | |
| 561-03-10 | | frequency tolerance, <of an oscillator> | |
| 561-03-11 | | frequency/voltage coefficient | |
| 561-03-12 | | harmonic distortion, <of an oscillator> | |
| 561-03-13 | | incidental frequency modulation | |
| 561-03-14 | | latch-up | |
| 561-03-15 | | linearity of frequency modulation deviation | |
| 561-03-16 | | long-term frequency stability | |
| 561-03-17 | | maximum time interval error | |
| 561-03-18 | | operating temperature range, <of an oscillator> | |
| 561-03-19 | | oven controlled crystal oscillator | |
| 561-03-20 | | overtone crystal controlled oscillator | |
| 561-03-21 | | phase jitter | |
| 561-03-22 | | phase noise | |
| 561-03-23 | | pulse duration | |
| 561-03-24 | | reference point temperature | |
| 561-03-25 | | reference temperature, <of an oscillator> | |
| 561-03-26 | | retrace characteristics | |
| 561-03-27 | | rise time | |
| 561-03-28 | | fractional frequency fluctuation | |
| 561-03-29 | | short-term frequency stability | |
| 561-03-30 | | simple packaged crystal oscillator | |
| 561-03-31 | | spectral purity | |
| 561-03-32 | | spurious oscillations | |
| 561-03-33 | | stabilization time | |
| 561-03-34 | | start-up time | |
| 561-03-35 | | symmetry | |
| 561-03-36 | | temperature compensated crystal oscillator | |
| 561-03-37 | | thermal transient frequency stability | |
| 561-03-38 | | time deviation | |
| 561-03-39 | | time interval error | |
| 561-03-40 | | tri-state output | |
| 561-03-41 | | voltage controlled crystal oscillator | |
| Section 561-04: Synthetic quartz crystal | |
| 561-04-01 | | AT-cut plate | |
| 561-04-02 | | as-grown Y-bar | |
| 561-04-03 | | as-grown Z-bar | |
| 561-04-04 | | as-grown synthetic quartz crystal | |
| 561-04-05 | | autoclave | |
| 561-04-06 | | dislocations | |
| 561-04-07 | | dopant | |
| 561-04-08 | | effective Z-dimension | |
| 561-04-10 | | etch channel | |
| 561-04-12 | | growth zones | |
| 561-04-13 | | hydrothermal crystal growth | |
| 561-04-14 | | impurity concentration | |
| 561-04-15 | | inclusion | |
| 561-04-16 | | infrared absorption coefficient | |
| 561-04-17 | | lumbered synthetic quartz crystal | |
| 561-04-20 | | minimum Z-dimension | |
| 561-04-23 | | pre-dimensioned bar | |
| 561-04-24 | | orthogonal axial system, <of α quartz crystal> | |
| 561-04-25 | | reference surface | |
| 561-04-26 | | ...-handed quartz crystal | |
| 561-04-27 | | seed | |
| 561-04-28 | | seed veil | |
| 561-04-29 | | synthetic quartz crystal | |
| 561-04-30 | | synthetic quartz crystal batch | |
| 561-04-31 | | twin | |
| 561-04-32 | | X-cut plate | |
| 561-04-33 | | Y-cut plate | |
| 561-04-34 | | Z-cut plate | |
| 561-04-35 | | z (minor rhombohedral) cut plate | |
| 561-04-36 | | growth band | |
| 561-04-37 | | internal transmittance | |
| 561-04-38 | | striae, pl | |
| Section 561-05: Piezoelectric ceramics | |
| 561-05-01 | | ageing, <of a material> | |
| 561-05-02 | | bulk acoustic wave | |
| 561-05-03 | | coupling factor, <of a piezoelectric ceramic> | |
| 561-05-04 | | Curie temperature, <of a piezoelectric material> | |
| 561-05-05 | | electric polarization | |
| 561-05-06 | | expansion vibration | |
| 561-05-07 | | ferroelectric material | |
| 561-05-08 | | flexural vibration | |
| 561-05-09 | | frequency constant | |
| 561-05-10 | | insulation resistance | |
| 561-05-11 | | length vibration | |
| 561-05-12 | | absolute permittivity | |
| 561-05-13 | | piezoelectric ceramics | |
| 561-05-14 | | piezoelectric effect | |
| 561-05-15 | | polarization, <in piezoelectric ceramics> | |
| 561-05-16 | | remanent polarization | |
| 561-05-17 | | spontaneous polarization | |
| 561-05-18 | | trapped vibration mode | |
| Section 561-06: Materials for dielectric devices | |
| 561-06-01 | | dielectric resonator material | |
| 561-06-02 | | electric constant of vacuum | |
| 561-06-03 | | relative permittivity | |
| 561-06-04 | | loss angle | |
| 561-06-05 | | electric loss factor | |
| 561-06-06 | | quality factor of a material | |
| 561-06-07 | | temperature coefficient of permittivity | |
| 561-06-08 | | coefficient of linear thermal expansion | |
| 561-06-09 | | complex relative permittivity | |
| Section 561-07: Materials for Surface Acoustic Wave (SAW) devices | |
| 561-07-02 | | back surface roughness | |
| 561-07-03 | | bevel | |
| 561-07-04 | | chip, <material for SAW devices> | |
| 561-07-05 | | congruent composition | |
| 561-07-06 | | contamination | |
| 561-07-07 | | crack, <material for SAW devices> | |
| 561-07-08 | | description of orientation and SAW propagation | |
| 561-07-09 | | diameter of wafer | |
| 561-07-10 | | dimple | |
| 561-07-11 | | fixed quality area | |
| 561-07-12 | | focal plane deviation | |
| 561-07-13 | | lattice parameter | |
| 561-07-14 | | lanthanum gallium silicate | |
| 561-07-15 | | lithium niobate | |
| 561-07-16 | | lithium tantalate | |
| 561-07-17 | | lithium tetraborate | |
| 561-07-18 | | local thickness variation | |
| 561-07-19 | | orange peel | |
| 561-07-20 | | orientation flat | |
| 561-07-21 | | percent local thickness variation | |
| 561-07-22 | | pit | |
| 561-07-23 | | polarization process | |
| 561-07-24 | | reduced lithium niobate | |
| 561-07-25 | | reduced lithium tantalate | |
| 561-07-26 | | reduction process, <material for SAW devices> | |
| 561-07-27 | | reference plane, <material for SAW devices> | |
| 561-07-28 | | scratch | |
| 561-07-29 | | secondary flat | |
| 561-07-30 | | single domain, <material for SAW devices> | |
| 561-07-31 | | site, <material for SAW devices> | |
| 561-07-32 | | sori | |
| 561-07-33 | | ST-cut | |
| 561-07-34 | | surface orientation | |
| 561-07-35 | | tolerance of surface orientation | |
| 561-07-36 | | thickness variation for five points | |
| 561-07-37 | | total thickness variation | |
| 561-07-38 | | warp, <material for SAW devices> | |
| 561-07-39 | | wafer thickness | |
| 561-07-40 | | manufacturing lot | |
| |