IEVref:815-22-10ID:
Language:enStatus: Standard
Term: magnetization critical current density
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Symbol: J cm MathType@MTEF@5@5@+= feaagKart1ev2aqatCvAUfeBSjuyZL2yd9gzLbvyNv2CaerbbjxAHX garuavP1wzZbItLDhis9wBH5garmWu51MyVXgarqqtubsr4rNCHbGe aGqipG0dh9qqqrpepC0xbbL8F4rqqrFfpeea0xe9Lq=Jc9vqaqpepm 0xbba9pwe9Q8fs0=yqaqpepae9pg0FirpepeKkFr0xfr=xfr=xb9ad baqaaiGaciGacmaaceqaaeaacaabaaGcbaGaamOsamaaBaaaleaaca qGJbGaaeyBaaqabaaaaa@35D8@
Definition: critical current density obtained by a magnetization measurement using a theoretical model (critical state model)

Note 1 to entry: If a material is non-uniform or anisotropic, J cm MathType@MTEF@5@5@+= feaagKart1ev2aqatCvAUfeBSjuyZL2yd9gzLbvyNv2CaerbbjxAHX garuavP1wzZbItLDhis9wBH5garmWu51MyVXgarqqtubsr4rNCHbGe aGqipG0dh9qqWrVepG0dbbL8F4rqqrVepeea0xe9LqFf0xc9q8qqaq Fn0lXdHiVcFbIOFHK8Feea0dXdar=Jb9hs0dXdHuk9fr=xfr=xfrpe WZqaaeaaciWacmGadaGadiaabaGaaqaaaOqaaiaadQeadaWgaaWcba Gaae4yaiaab2gaaeqaaaaa@3822@ differs from the transport critical current density, J ct MathType@MTEF@5@5@+= feaagKart1ev2aqatCvAUfeBSjuyZL2yd9gzLbvyNv2CaerbbjxAHX garuavP1wzZbItLDhis9wBH5garmWu51MyVXgarqqtubsr4rNCHbGe aGqipG0dh9qqWrVepG0dbbL8F4rqqrVepeea0xe9LqFf0xc9q8qqaq Fn0lXdHiVcFbIOFHK8Feea0dXdar=Jb9hs0dXdHuk9fr=xfr=xfrpe WZqaaeaaciWacmGadaGadiaabaGaaqaaaOqaaiaadQeadaWgaaWcba accaGaa83yaiaa=rhaaeqaaaaa@382F@ .

Note 2 to entry:  J cm MathType@MTEF@5@5@+= feaagKart1ev2aqatCvAUfeBSjuyZL2yd9gzLbvyNv2CaerbbjxAHX garuavP1wzZbItLDhis9wBH5garmWu51MyVXgarqqtubsr4rNCHbGe aGqipG0dh9qqWrVepG0dbbL8F4rqqrVepeea0xe9LqFf0xc9q8qqaq Fn0lXdHiVcFbIOFHK8Feea0dXdar=Jb9hs0dXdHuk9fr=xfr=xfrpe WZqaaeaaciWacmGadaGadiaabaGaaqaaaOqaaiaadQeadaWgaaWcba Gaae4yaiaab2gaaeqaaaaa@3822@ takes sometimes smaller values than J ct MathType@MTEF@5@5@+= feaagKart1ev2aqatCvAUfeBSjuyZL2yd9gzLbvyNv2CaerbbjxAHX garuavP1wzZbItLDhis9wBH5garmWu51MyVXgarqqtubsr4rNCHbGe aGqipG0dh9qqWrVepG0dbbL8F4rqqrVepeea0xe9LqFf0xc9q8qqaq Fn0lXdHiVcFbIOFHK8Feea0dXdar=Jb9hs0dXdHuk9fr=xfr=xfrpe WZqaaeaaciWacmGadaGadiaabaGaaqaaaOqaaiaadQeadaWgaaWcba accaGaa83yaiaa=rhaaeqaaaaa@382F@ because of the different electric field strength caused by the flux creep, especially for high-temperature superconductors.

Note 3 to entry: This entry was numbered 815-12-09 in IEC 60050-815:2015.


Publication date:2024-08
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